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Dr. Prikshit Gautam Resume(pdf)

  Post Doctoral Fellow
  c/o Prof. R. P. Tandon
  Department of Physics and Astrophysics
  University of Delhi
  New Delhi - 110007

Contact No. : +91-9871810585
Date of Birth: 15th October, 1978
Email: pgautam.phy.du@gmail.com
Web URL : http://people.du.ac.in/~rptandon9

  Nationality : Indian
  Permanent Address : Village and Post-office   Duttnager, Tehsil Rampur, District Shimla,   Himachal Pradesh  

Current Research Interest

  1. Synthesis and Characterisation of Magnetic Nanoparticles For Use In Hyperthermia For Cancer Treatment
  2. Synthesis and Characterisation of Solution-Processed Reduced Graphene Oxide ( rGO) Films as Transparent Electrode Material for Organic Solar Cell, Lithium ion Battery and Bio-sensor Applications.
  3. Bio-functionalized graphene-graphene oxide nanocomposite based electrochemical immunosensing and glucose sensor
  4. Photo super capacitor using graphene-graphene oxide nanocomposites

Educational Qualification

  • Ph.D. 2011: "Synthesis and Characterization of Lead free ferroelectric thin films" from Department of Physics and     Astrophysics, University of Delhi, Delhi, India
  • M. Phil 2005: "Solar Neutrino Problem in Light of Sudbury Neutrino Observatory Experiment" from H.P.Univ.     Shimla, Himachal Pradesh, India
  • Master of Science (M.Sc.). 2003: Physics from H.P.Univ. Shimla, Himachal Pradesh, India
  • Research Experience

  • Six years Research Experience
  • Elevan Research Papers published In International refereed Journals and one Communicated
  • National/International Conferences Attended: Eight
  • Completed 'PhD program Module" from IUAC (NSC) New Delhi. (2006)
  • Swift Heavy Ion Irradiation study on BLT thin films (2006-2008) Completed Research project (Three years)     sponsored by IUAC (Govt. of India UGC) New Delhi.
  • Teaching Experience (Undergraduate)

    Assistant Professor, Physics department, Kirori Mal College, University of Delhi, Delhi. ~ Three years

    Material Characterization Techniques Known

    Structure and Morphology: X-ray Diffraction (XRD), Atomic force microscopy (AFM), Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Electrical, Ferroelectric and Magnetic: Polarization vs Electric field (P-E Loop tracer), Complex Impedance Spectroscopy (Wayne-kerr), Leakage current characterization (Source meter-2400), LCR meter (Fluke PM 6306), M-H loop, Optical - Spectroscopic Ellipsometry (J A Woollam), UV-spectroscopy (Shimadzu), Photoluminescence (Dongwoo optron), Raman spectroscopy (inVia Renishaw), BET (Surface area and pore size analysis) Nova win.

    Software Known for data analysis

    MSOffice, Origin (data analysis), SPMLab (AFM), ImageJ (SEM), Zview (impedance analysis)
    Rietvield Analysis, POWDX, CHEKCELL (XRD), SRIM, TRIM (simulation codes For Swift Heavy Ion Irradiation), WVASE32 (J. A. Woollam)-for Model fitting in Spectroscopic ellipsometry studies.

    Affiliation to Professional Societies

  • Materials Research Society of India (MRSI)
  • Electron Microscope Society of India (EMSI)
  • Society for Technological Advanced Materials of India (STAMI)
  • List of Refrees

    • Prof. R P Tandon, Department of Physics and Astrophysics, University of Delhi, North Campus, Delhi 100007, India, Mobile No. +91-9818229608 Email: ram_tandon@hotmail.com
    • Prof. S. D. Sharma, Department of Physics, Himachal Pradesh University, Shimla, H.P. India 171005, Email: dev57@yahoo.com, Phone: +91-9418075655
    • Dr. Sudipta Bhattacharyya, Scientist-D, Electroceramics Group, Solid State Physics Laboratory (SSPL) DRDO, Lucknow Road, Timarpur, Delhi, India 110 054 - Phone: +91-9868885562, Email: sudipto_iisc@yahoo.com

    List of Publications

    1. Prikshit Gautam, Sushil K. Singh, R. P. Tandon, Dielectric Functions and Energy Band Gap Variation Studies of Manganese doped Bi3.25La0.75Ti3O12 Thin Films using Spectroscopic Ellipsometry,Journal of Alloys and Compounds, Accepted Manuscript July, 30, 2014.
    2. Prikshit Gautam, Sushil K. Singh, R. P. Tandon, "Mechanism for leakage current conduction in manganese doped Bi3.25La0.75Ti3O12 (BLT) ferroelectric thin films",Journal of Alloys and Compounds 606 (2014) 132–138, DOI: 10.1016/j.jallcom.2014.03.139.
    3. Kuldeep Singh, Ashish, K Sen, R K Kotnala, Mahesh Kumar, Prikshit Gautam, M. Singh, “Room Temperature Long Rang Ordering in (BiFeO3)1-x(PbTiO3)x NanoCrystallites, J. Appl. Phys. 109, 123911 (2011); doi:10.1063/1.3592281
    4. Prikshit Gautam, S. Bhattacharyya, Sushil K. Singh, Ravi Kumar, R. P. Tandon “Effect of zirconium doping on ferroelectric properties and leakage current mechanism in Bi3.25La0.75Ti3O12 (BLT) thin films” Accepted in Physica status solidi- B- Article number: pssb.201046308, http://dx.doi.org/10.1002/pssb.201046308
    5. Epsita Ghanti, Nobel Tomar, Prikshit Gautam and R. Nagarajan, “Synthesis of high surface area transitional alumina from Al(OPh)3”, Journal of Sol-Gel Science and Technology DOI: 10.1007/s10971-010-2316-4
    6. Prikshit Gautam, S. Bhattacharyya, Sushil K Singh, R P Tandon “Fabrication and Characterization of Bismuth Lanthanum Titanate (Bi3.25La0.75Ti3O12) thin films for FeRAM devices” Integrated Ferroelectrics, 119:1–11, 2010, DOI: 10.1080/10584587.2010.492288
    7. Prikshit Gautam, S. Bhattacharyya, Sushil K Singh, R P Tandon “Mechanism of leakage current conduction in Silicon doped Bi3.25La0.75Ti3O12 (BLT) thin films prepared by sol gel method”, accepted in International Journal of Modern Physics-B, January 2010, Ms. No. JPB20072000R1
    8. Prikshit Gautam, Anupama Sachdeva, Manoj Arora, Sushil K Singh, R P Tandon “Dielectric functions of Niobium doped Bi3.25La0.75Ti3O12 thin films using spectroscopic ellipsometry”, Integrated Ferroelectrics, 119:1–8, 2010, DOI: 10.1080/10584587.2010.492293
    9. Anupama Sachdeva, Vandana Luthra, Prikshit Gautam, R P Tandon “Dielectric and Ferroelectric studies on sol-gel derived calcium modified lead Zirconate Titanate ceramics”, Integrated Ferroelectrics, 119:1–9, 2010, DOI: 10.1080/10584587.2010.492289
    10. Anupama Sachdeva, Vandana Luthra, Prikshit Gautam, R P Tandon “Structural and electrical properties of Lead Zirconate Titanate 0-3 composite films”, Integrated Ferroelectrics, 119:1–10, 2010, DOI: 10.1080/10584587.2010.492294.
    11. Raman Kashyap, Tanuj Dhawan, Prikshit Gautam, O. P. Thakur, N. C. Mehra, R. P. Tandon, “Effect of Processing Conditions on Electrical Properties of CaCu3Ti4O12 Ceramics”, Modern Physics Letters B, Vol. 24, No. 12 (2010) 1267–1273, DOI: 10.1142/S021798491002327X
    12. K.C. Verma, R.K. Kotnala, M.C. Mathpal, N. Thakur, Prikshit Gautam, N.S. Negi, “Dielectric properties of nanocrystalline Pb0.8Sr0.2TiO3 thin films at different annealing temperature”, Materials Chemistry and Physics, 114 (2009) 576–579
    13. Prikshit Gautam, Anupama Sachdeva, Sushil K Singh, R P Tandon “Dielectric functions of Manganese doped Bi3.25La0.75Ti3O12 thin films using spectroscopic ellipsometry’’ Under review, Journal of Alloys and Compound

     

     

     
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