Referred Journals


Spectroscopic ellipsometry study of the free carrier absorption and bandgap of ZnO thin films: Effect of nonstoichiometry C. Singh, S.Nozaki, and Shyama Rath J. Appl. Phys. 118 (2015) DOI: 10.1063/1.4935629
UV photoluminescence from nanocrystalline tin oxide synthesized by a one-step hydrothermal method Vijayarangamuthu Kalimuthu & Shyama Rath, Materials Letters157(2015)11–14
Nanostructured tin oxide as a surface-enhanced- Raman-scattering substrate for detection of nitroaromatic compounds,K.Vijayarangamuthu and ShyamaRath, Int. J. Appl. Ceram. Technol., (2014) DOI:10.1111/ijac.12266
Nanoparticle size, oxidation state, and sensing response of tin oxide nanopowders using Raman spectroscopy , K. Vijayarangamuthu and Shyama Rath, Journal of Alloys and Compounds610, 706 (2014)
Effect of Thermal Annealing and Swift Heavy Ion Irradiation on the Optical Properties of Indium Oxide Thin Films, Neeti Tripathi,and Shyama Rath, ECS Journal of Solid State Science and Technology, 3 (3) P21-P25 (2014)
Facile synthesis of ZnO nanostructures and investigation of structural and optical properties, Neeti Tripathi and Shyama Rath, Materials Characterization. 86 263 (2013)
Spectroscopic ellipsometry and multiphonon Raman spectroscopic study of excitonic effects in ZnO films, Chaman Singh and Shyama Rath, J. Appl. Phys. 113 art. no. 163104 (2013)
Antireflection properties of graphene layers on planar and textured silicon surfaces , R. Kumar, A.K. Sharma, M. Bhatnagar, B.R. Mehta , S . Rath, Nanotechnology24(16) 165402 (2013)
Effect of Co doping and thermal annealing on the optical properties of tin oxide nanopowders, K.Vijayarangamuthu and S. Rath, Appl. Phys. A doi 10.1007/s00339-013-7805-1 (2013)

Evolution of ripple morphology on Si(100) by 60 keV argon ions
, S.K.Garg, V Vengopal,T.Basu, O.P Sinha, S. Rath, D. Kanjilal,T. Som, Applied Surface Science 258 (9) , (2012) 4135
A spectroscopic ellipsometric study of the tunability of the optical constants anickness of GeOx films with swift heavy ions ,K. Vijayarangamuthu, C.Singh, D.Kabiraj,S. Rath,J. Appl. Phys 110 (6) , (2011) art. no. 063512
Determination of generalised Stokes parameters for unpolarised, polarised, and partially polarised light beams, B.Kanseri, S. Rath, H.C. Kandpal, Proc. SPIE The International Society for Optical Engineering 8173 , (2012) art. no. 817318
Refractive index of Ge nanocrystals embedded in a GeOx matrix K. Vijayaragamuthu, C. Singh,S. Rath, AIP Conf. Proceedings 1349 (PART A) , (2011) 785
Swift heavy ion nducednanopatterning of indium oxide films, N.Tripathi, A.Tripathi, S. Rath, Radiation Effects and Defects in Solids 166 (8-9) , (2011) 578
A Raman spectroscopic study of structural evolution of electrochemically deposited ZnO films with deposition time Neeti Tripathi, K. Vijayrangamuthu and ShyamaRath, Materials Chemistry and Physics, 126, (2011). 568
Growth dynamics of pulsed laser deposited indium oxide thin films: a substrate dependent study, NeetiTripathi, ShyamaRath, V. Ganesan, R.J. Choudhary, Applied Surface Science, 256, 7091-7096 (2010)
Swift heavy ion induced modifications in indium oxide films, NeetiTripathi, ShyamaRath, P. Kulriya, S. A. Khan, D. Kabiraj, and D. K. Avasthi. Nucl. Instr. & Phys. Res. B. 268,3335-3339 (2010)
Optical and room temperature sensing properties of highly oxygen deficient flower like ZnO nanostructures, N K Singh, Sadhna Srivastava, ShyamaRath and S Annapoorni Appl. Surf. Sci. 257 (2010) 1554
A scheme for data encryption and transmission using temporal correlation-based spectral switches, Bhaskar Kanseri, Shyama Rath, Hem Chandra Kandpal Optik, 121 (2010) 1831

Before 2010

Enhanced Raman scattering from a Ge monolayer of low-density nanocrystals, S. Rath,Somaditya Sen, Shinji Nozaki, Masahide Tona , ShunsukeOhtani, K P Jain Advanced Science Letters2 (2009)377
Direct determination of the generalized Stokes parameters from the usual Stokes parameters, B Kanseri, S. Rath and HC Kandpal, Optics Letters34 (2009) 719
A modified version of Young’s interferometer to study the Fresnel and Arago interference laws, B Kanseri, NS Bisht, S Rath, and HC Kandpal, “,” European Journal of Physics, 30 (2009) 835
Structural, optical and morphological characterization of ZnO nanostructure fabricated by electrochemical deposition, Kamal N. Singh, NeetiTripathi, S.Rath,S.AnnapoorniJ. of Nanoscience and Nanotechnology,9 (2009)
Determination of the beam-coherence polarization matrix of a random electromagnetic beam, B Kanseri, S Rath and HC Kandpal, “” IEEE Journal of Quantum Electronics, 45 (2009) 1163
Determination of the amplitude and the phase of the electric cross-spectral density matrix by spectral measurements, B Kanseri, S Rath and HC Kandpal, Optics Communication 282, (2009) 3059
Ge nanocrystal formation is Ge oxide matrix formed by thermal annealing of GeOx films Vijayarangamuhu K, Shyama Rath, D K Avasthi, D Kabiraj, PavanKulriya, V N Singh, B R Mehta J. Vac. Sci. & Technol. A 27 (2009)731
Experimental observation of the Fresnel and Arago laws using Mach-Zehnder interferometer, Bhaskar Kanseri, Nandan Bisht, Shyama Rath and Hem Chandra Kandpal,Amer. J. Phys. 76, (2008) 39
Fabrication of nanopatterned germanium surface by laser-induced etching: AFM, Raman and PL studies: Manoj Kumar, H.S.Mavi, S.Rath,A.K.Shukla, V.D. Vankar. Physica E40 (2008) 2904
Raman study on single-walled carbon nanotubes with different laser excitation energies, S S Islam, Khurshed Ahmad Shah,H S Mavi, A K Shukla, S Rath, Harsh, Bull. Mater. Sci.30, (2007)295
Evidence of nanostructure formation in Ge oxide by crystallization induced by swift heavy ion irradiation, S Rath, D.Kabiraj, and D.K. Avasthi , , H. S. Mavi, Nucl. Instr. Meth. in Phys. Res. B 263 (2007) 419
Quantum Confinement effects in silicon nanocrystals produced by laser-induced etching and cw laser annealing, H.S.Mavi, A.K.Shukla, Rajesh Kumar,S.Rath, Bipin Joshi and S.S.Islam, Semicond. Sci. Technol.21 (2006) 1627
Formation of Si and Ge quantum structures by laser-induced etching, H. S. Mavi, SudakshinaPrusty, Manoj Kumar, Rajesh Kumar, A. K. Shukla, and S. Rath, Phys. Stat. Sol. (A)203, (2006) 2444
Raman and photoluminescence investigations of impurities in zinc- rich ZnxCd1-xSe, L.Gupta, S.Rath and S.C.Abbi, Mat. Sci. Engg. B119 (2005) 171
Laser generation of Si nanocrystals and optical spectroscopic investigations, H.S.Mavi, S.Rath,A.K.Shukla, Sci. Technol. of Nanomaterials23 43 (2004)
Laser-induced etching of Cr-O doped GaAs and wavelength dependent photoluminescence, H.S. Mavi, S.S.Islam, S.Rath, B.S. Chauhan, A.K.Shukla, Mater. Chem. Phys.86 414 (2004)
Temperature dependence of the fundamental bandgap in Zn1-xCdxSe ,Lalita Gupta, S. Rath, S.C.Abbi, and F.C. Jain : Pramana:J. of Physics61 1 (2003)
Charge transport in thick epitaxial GaAs grown by vapour-based chemical reaction, P.J.Sellin, H. El- Abbassi, S.Rath, J.C. Bourgoin, and G.C. Sun : Nucl. Instr. Meth. Phys. Res. A, 512 (2003) 433
Microscopic variations in material and charge transport properties in CdZnTe radiation detectors, S. Rath,P.J.Sellin et al ,Nucl. Instrum. Meth. Phys. Res. A,512 (2003) 427
Alloy effects on the Raman spectra of Si1-x Gex alloys/heterostructures and calibration protocols for determination of alloy compositions, S.Rath, P. Etchegoin, M.L.Hsieh, and R A Stradling: Semicond. Sci. Technol. 18 (2003)566
Characterisation of thick epitaxial GaAs for x-ray detection, H.Samic et al Nucl. Instrum. Meth. Phys. Res. A 487 (2002) 107
Characterisation of Vertical Gradient Freeze semi-insulating InP for use as a nuclear radiation detector, H.El- Abbassi, S.Rath, and P.J. Sellin, Nucl. Instrum. Meth. Phys. Res. A, 466 (2001) 47
Polarization-dependent Raman spectroscopic protocols for calibration of the alloy composition and strain in bulk and thin-film SiGe, S Rath, C Grigorescu, M L Hsieh, E Voudouris and R A Stradling, Semicond. Sci. Technol.15 (2000) L1
Optical properties of tetragonal germanium nanocrystals deposited by the cluster-beam evaporation technique: New light emitting material for future S Nozaki, S Sato, S Rath, H Ono, H Morisaki, Bul. Mater. Sci. , 377 (1999)
Study of growth process of germanium nanocrystals using a grazing incidence x-ray diffraction method, H Ninomiya, Itoh,S Rath, S Nozaki, H Morisaki, J. Vac. Sci. Technol B 17 (1999) 1903
Volume plasmons in porous silicon, S. Sato, S. Rath, S. Akiyama, S. Nozaki and H. Morisaki,
J. Appl. Phys. 86 1774 ( 1999)
Oxidation characteristics of Ge nanocrystals embedded in an SiO2 matrix, ShyamaRath, T. Yamada, S.Sato, H.Ono, S. Nozaki and H.Morisaki J. Surf. Analy. 3 (1998) 251
Evidence of a tetragonal structure of germanium nanocrystals prepared by the cluster-beam deposition technique, ShyamaRath, S. Sato, H. Ono, S. Nozaki and H.Morisaki, Mater. Chem. Phys,54(1-3), (1998) 244
Compositional and temperature-induced effects on the phonon spectra of narrow-bandgap Hg1-xCdxTe, Shyama Rath, K.P.Jain, S.C.Abbi, M.Balkanski and C.Julien, Phys. Rev. B, 52 (1995) 17172
Forbidden one-LO phonon resonant Raman and multi-phonon scattering in pure CdTe crystals, S. S. Islam, ShyamaRath, K.P.Jain, S.C.Abbi, M.Balkanski and C.Julien, Phys. Rev. B 46, 19924982)
Chapter in Book: Raman scattering from Ge small particles, ShyamaRath, S.Sato, S.Nozaki, H.Ono, H.Morisaki, Phys. of Semicond. Nanostructures; ed. by K. P. Jain, Narosa Publishing House, 1997

Conference Proceedings