Research summary

1. Optical characterization of semiconductor thin films:
   Raman spectroscopy, photoluminescence spectroscopy, spectroscopic ellipsometry
2. Fabrication of semiconductor thin films and nanostructures:physical and chemical deposition methods
3. Colloidal synthesis and optical properties of metal nanoparticles
4. Sensing based on surface enhanced Raman scattering
5. Ion-beam analyses and modification of materials
6. Semiconductor radiation detectors
7. Photon metrology

Spectroscopic ellipsometry of ZnO films

TEM of hydrothermal SnO2

Raman spectra of SnO2

Raman spectra of ZnO films